This program sets the report generator parameters, it is used to:
Define the ATP test header, referencing specifications (both external and internal)
Define ATP test sections.
Define individual sub-tests (under sections) with optional pass/fail criteria.
Setup graphing parameters.
Setup coding for protected data (codes are stored in standard, unprotected format; classified systems must be controlled)
Define specification limits (minimum or maximum or min/max)
Operation:
Once editing is complete, the “Save” button stores the changes to the selected report, “Save As New” creates a new DB record with the edited changes and “Cancel” aborts all changes.
Editing:
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Product Parameters: The product parameters are used to identify the device and to populate the report header. Specification numbers and revisions would be used for QC |
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Sections: It is presumed the ATP test will be divided into sections, DC electrical, RF electrical and mechanical parameters as an example. These are defined by the user and may correspond to customer specifications. |
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Tests: Tests may be multiple single-valued parameters or one swept curve under one section. Only those tests that reported under the selected section (from above) are displayed for editing. The “Test Table” and corresponding “Test Field” are displayed directly from the actual database, the operator may only select from real, existing and authorized database tables and fields. The values for a particular device from the referenced “Test Field” may be limit checked against the Min/Max limits. Multiple tests may be organized under a section, these are displayed in tabular form. Note: None of the editor programs enable the user to modify the tables of the database, table modifications should be through the native DB client tools. |
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Swept Tests: Swept test data comes from the above “Test Table”. The “X” and “Y” fields are enforced to come from that table only. The axis limits and tick marks are defined in this section. One-only swept test may be defined per section. |
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Code Data: Swept tests may be coded in the “X”, “Y” or both axis. These codes will only work properly when located on tick marks. |
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Swept Limits: Swept tests limits are linear interpolated between these spec points. |
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